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dc.title | How can V-I characteristics help in counterfeit component detection | en |
dc.contributor.author | Neumann, Petr | |
dc.contributor.author | Adámek, Milan | |
dc.contributor.author | Skočík, Petr | |
dc.relation.ispartof | Annals of DAAAM and Proceedings of the International DAAAM Symposium | |
dc.identifier.issn | 1726-9679 Scopus Sources, Sherpa/RoMEO, JCR | |
dc.identifier.isbn | 978-3-901509-83-4 | |
dc.date.issued | 2011 | |
dc.citation.spage | 57 | |
dc.citation.epage | 58 | |
dc.event.title | Annals of DAAAM for 2011 and 22nd International DAAAM Symposium "Intelligent Manufacturing and Automation: Power of Knowledge and Creativity" | |
dc.event.location | Vienna | |
utb.event.state-en | Austria | |
utb.event.state-cs | Rakousko | |
dc.event.sdate | 2011-11-23 | |
dc.event.edate | 2011-11-26 | |
dc.type | conferenceObject | |
dc.language.iso | en | |
dc.publisher | Danube Adria Association for Automation and Manufacturing, DAAAM | |
dc.identifier.doi | 10.2507/22nd.daaam.proceedings.029 | |
dc.relation.uri | https://daaam.info/22nd-proceedings-2011 | |
dc.relation.uri | https://www.daaam.info/Downloads/Pdfs/proceedings/proceedings_2011/029.pdf | |
dc.subject | counterfeit component | en |
dc.subject | counterfeit detector | en |
dc.subject | pin print | en |
dc.subject | scan profile | en |
dc.subject | V-I characteristic | en |
dc.description.abstract | The counterfeit electronic components represent a serious problem nowadays. This paper illustrates a V-I characteristic based counterfeit detector application possibilities. The electronic component V-I characteristics express a relationship between the current flowing via a chosen couple of pins, and the voltage applied on those pins. The applied voltage course follows a certain function like sinus, triangle or ramp between safe limits. The V-I characteristics of an individual component type can differ according to production technology, according to particular manufacturer, or according to the measurement conditions itself. The natural differences can be subsumed in the model component pin print which can be used for the comparative analysis aimed at discovering unnatural differences caused by improper treatment, failure or by the counterfeiting process. | en |
utb.faculty | Faculty of Applied Informatics | |
dc.identifier.uri | http://hdl.handle.net/10563/1011240 | |
utb.identifier.obdid | 43866781 | |
utb.identifier.scopus | 2-s2.0-84904289153 | |
utb.source | d-scopus | |
dc.date.accessioned | 2023-01-06T08:03:57Z | |
dc.date.available | 2023-01-06T08:03:57Z | |
utb.contributor.internalauthor | Neumann, Petr | |
utb.contributor.internalauthor | Adámek, Milan | |
utb.contributor.internalauthor | Skočík, Petr | |
utb.fulltext.dates | - | |
utb.fulltext.sponsorship | The work has been supported by the Ministry of Education, Youth and Sports of the Czech Republic under the Research Plan No. MSM 7088352102 and by the European Regional Development Fund under the project CEBIA-Tech No. CZ.1.05/2.1.00/03. This support is very gratefully accepted. | |
utb.fulltext.projects | MSM 7088352102 | |
utb.fulltext.projects | CZ.1.05/2.1.00/03 | |
utb.fulltext.faculty | - | |
utb.fulltext.ou | - |