Advanced microscopic techniques used for integrated circuits authenticity analysis

Abstract

Many electronic systems used in industry or other special areas are put at risk by counterfeit electronic components occurrence, especially by semiconductors. These counterfeit components represent a serious threat for systems functionality and reliability. We can take as a fraudulent or as a suspicious component any component of unknown origin, which we can find any difference in contrast to the original manufacturer component of the same model. This article describes advanced microscopic techniques used in problems with counterfeit integrated circuits. Their genuineness evaluation ability is discussed and illustrated with several microscopic images. © 2018 Institute of Physics Publishing. All rights reserved.